EPM3064ATC100-10

 

 

■ High–performance, low–cost CMOS EEPROM–based programmable 

logic devices (PLDs) built on a MAX® architecture (see Table 1)

■ 3.3-V in-system programmability (ISP) through the built–in 

IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface with 

advanced pin-locking capability

– ISP circuitry compliant with IEEE Std. 1532

■ Built–in boundary-scan test (BST) circuitry compliant with 

IEEE Std. 1149.1-1990

■ Enhanced ISP features:

– Enhanced ISP algorithm for faster programming

– ISP_Done bit to ensure complete programming

– Pull-up resistor on I/O pins during in–system programming

■ High–density PLDs ranging from 600 to 10,000 usable gates 

■ 4.5–ns pin–to–pin logic delays with counter frequencies of up to 

227.3 MHz

■ MultiVoltTM I/O interface enabling the device core to run at 3.3 V, 

while I/O pins are compatible with 5.0–V, 3.3–V, and 2.5–V logic 

levels

■ Pin counts ranging from 44 to 256 in a variety of thin quad flat pack 

(TQFP), plastic quad flat pack (PQFP), plastic J–lead chip carrier 

(PLCC), and FineLine BGATM packages

 

 

 

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